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1

Measurement uncertainty evaluation: Could it help to improve engineering design?

Rajan, Arvind, Kuang, Ye Chow, Ooi, Melanie Po-Leen, Demidenko, Serge N.

Journal:

IEEE Instrumentation & Measurement Magazine

Year:

2019

Language:

english

File:

PDF, 1.38 MB

english, 2019

2

Choice of rainfall inputs for event-based rainfall-runoff modeling in a catchment with multiple rainfall stations using data-driven techniques

Chang, Tak Kwin, Talei, Amin, Alaghmand, Sina, Ooi, Melanie Po-Leen

Journal:

Journal of Hydrology

Year:

2017

Language:

english

File:

PDF, 821 KB

english, 2017

3

[IEEE 2017 IEEE International Conference on Computational Intelligence and Virtual Environments for Measurement Systems and Applications (CIVEMSA) - Annecy, France (2017.6.26-2017.6.28)] 2017 IEEE International Conference on Computational Intelligence and Virtual Environments for Measurement Systems and Applications (CIVEMSA) - Family of low-cost NI ELVIS/LabVIEW-based semiconductor testers for engineering education

Chew, Moi Tin, Demidenko, Serge, Po-Leen Ooi, Melanie, Chow Kuang, Ye

Year:

2017

Language:

english

File:

PDF, 32.68 MB

english, 2017

4

Moment-Constrained Maximum Entropy Method for Expanded Uncertainty Evaluation

Rajan, Arvind, Kuang, Ye Chow, Ooi, Melanie Po-Leen, Demidenko, Serge, Carstens, Herman

Journal:

Year:

2018

Language:

english

File:

PDF, 1.72 MB

english, 2018

5

Automated Visual Inspection System for Mass Production of Hard Disk Drive Media

Zhi Sheng Chow, Melanie Po-Leen Ooi, Ye Chow Kuang, Serge Demidenko

Journal:

Procedia Engineering

Year:

2012

Language:

english

File:

PDF, 859 KB

english, 2012

6

Standard uncertainty evaluation of multivariate polynomial

Kuang, Ye Chow, Rajan, Arvind, Ooi, Melanie Po-Leen, Ong, Tat Chern

Journal:

Year:

2014

Language:

english

File:

PDF, 1.27 MB

english, 2014

7

Identifying Systematic Failures on Semiconductor Wafers Using ADCAS

Ooi, Melanie Po-Leen, Sok Hong Kuan,, Ye Chow Kuang,, Huiyuan Cheng,, Sim, Eric Kwang Joo, Demidenko, Serge N., Chan, Chris Wei Keong

Journal:

IEEE Design and Test

Year:

2013

Language:

english

File:

PDF, 1.05 MB

english, 2013

8

Parameter optimization of polymer electrolyte membrane fuel cell using moment-based uncertainty evaluation technique

Rajan, Arvind, Garg, Akhil, Vijayaraghavan, V., Kuang, Ye Chow, Ooi, Melanie Po-Leen

Journal:

Journal of Energy Storage

Year:

2018

Language:

english

File:

PDF, 1.73 MB

english, 2018

9

[IEEE 2017 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) - Torino, Italy (2017.5.22-2017.5.25)] 2017 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) - Moments and maximum entropy method for expanded uncertainty estimation in measurements

Rajan, Arvind, Chow Kuang, Ye, Po-Leen Ooi, Melanie, Demidenko, Serge N.

Year:

2017

Language:

english

File:

PDF, 424 KB

english, 2017

10

Measurement uncertainty evaluation: Could it help to improve engineering design?

Rajan, Arvind, Kuang, Ye Chow, Ooi, Melanie Po-Leen, Demidenko, Serge N.

Journal:

IEEE Instrumentation & Measurement Magazine

Year:

2019

File:

PDF, 1.38 MB

2019

11

Statistical measures of two dimensional point set uniformity

Meng Sang Ong, Ye Chow Kuang, Melanie Po-Leen Ooi

Journal:

Computational Statistics & Data Analysis

Year:

2012

Language:

english

File:

PDF, 2.31 MB

english, 2012

12

Low-Cost Microcontroller-based Hover Control Design of a Quadcopter

Bernard Tat Meng Leong, Sew Ming Low, Melanie Po-Leen Ooi

Journal:

Procedia Engineering

Year:

2012

Language:

english

File:

PDF, 528 KB

english, 2012

13

Defect cluster recognition system for fabricated semiconductor wafers

Ooi, Melanie Po-Leen, Sok, Hong Kuan, Kuang, Ye Chow, Demidenko, Serge, Chan, Chris

Journal:

Engineering Applications of Artificial Intelligence

Year:

2013

Language:

english

File:

PDF, 4.55 MB

english, 2013

14

[IEEE 2007 IEEE Instrumentation & Measurement Technology Conference IMTC 2007 - Warsaw, Poland (2007.05.1-2007.05.3)] 2007 IEEE Instrumentation & Measurement Technology Conference IMTC 2007 - Real-Time Malaysian Sign Language Translation using Colour Segmentation and Neural Network

Akmeliawati, Rini, Ooi, Melanie Po-Leen, Kuang, Ye Chow

Year:

2007

Language:

english

File:

PDF, 1.54 MB

english, 2007

15

[IEEE 2014 IEEE Sensors Applications Symposium (SAS) - Queenstown, New Zealand (2014.02.18-2014.02.20)] 2014 IEEE Sensors Applications Symposium (SAS) - Fast and robust zebrafish segmentation and detection algorithm under different spectrum conditions

Tan, Jei Shian, Chang, Tak Kwin, Ooi, Melanie Po-Leen, Kuang, Ye Chow, Tan, Chee Pin, Kitahashi, Takashi

Year:

2014

Language:

english

File:

PDF, 788 KB

english, 2014

16

[IEEE 2014 IEEE Sensors Applications Symposium (SAS) - Queenstown, New Zealand (2014.02.18-2014.02.20)] 2014 IEEE Sensors Applications Symposium (SAS) - Detecting spongiosis in stained histopathological specimen using multispectral imaging and machine learning

Abeysekera, Sanush, Ooi, Melanie Po-Leen, Kuang, Ye Chow, Tan, Chee Pin, Hassan, Sharifah Syed

Year:

2014

Language:

english

File:

PDF, 2.99 MB

english, 2014

17

[IEEE 2010 International Conference on Computer Applications and Industrial Electronics (ICCAIE) - Kuala Lumpur, Malaysia (2010.12.5-2010.12.8)] 2010 International Conference on Computer Applications and Industrial Electronics - Fast and accurate human detection for video applications using edgelets

Chowdhury, Mohammed Shahnewaz, Kuang, Ye Chow, Ooi, Melanie Po-Leen

Year:

2010

Language:

english

File:

PDF, 306 KB

english, 2010

18

[IEEE 2010 IEEE Instrumentation & Measurement Technology Conference Proceedings - Austin, TX, USA (2010.05.3-2010.05.6)] 2010 IEEE Instrumentation & Measurement Technology Conference Proceedings - Optimal frequency selection algorithm for ADC frequency domain dynamic tests

Ong, Meng Sang, Kuang, Ye Chow, Ooi, Melanie Po-leen, Demidenko, Serge, Soo, Kui Ting, David, Homer

Year:

2010

Language:

english

File:

PDF, 641 KB

english, 2010

19

[IEEE 2014 IEEE Sensors Applications Symposium (SAS) - Queenstown, New Zealand (2014.02.18-2014.02.20)] 2014 IEEE Sensors Applications Symposium (SAS) - Standard Uncertainty estimation on polynomial regression models

Rajan, Arvind, Kuang, Ye Chow, Ooi, Melanie Po-Leen, Demidenko, Serge

Year:

2014

Language:

english

File:

PDF, 785 KB

english, 2014

20

[IEEE 2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) - Minneapolis, MN, USA (2013.05.6-2013.05.9)] 2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) - Using the ADTree for feature reduction through knowledge discovery

Sok, Hong Kuan, Chowdhury, Mohammed Shahnewaz, Ooi, Melanie Po-Leen, Kuang, Ye Chow, Demidenko, Serge

Year:

2013

Language:

english

File:

PDF, 108 KB

english, 2013

21

[IEEE 2013 IEEE International Conference on Smart Instrumentation, Measurement and Applications (ICSIMA) - Kuala Lumpur, Malaysia (2013.11.25-2013.11.27)] 2013 IEEE International Conference on Smart Instrumentation, Measurement and Applications (ICSIMA) - Distributed human detection on mobile platform

Chong, Kaizen, Ooi, Melanie Po-Leen, Chowdhury, Mohammed S., Kuang, Ye Chow

Year:

2013

Language:

english

File:

PDF, 8.68 MB

english, 2013

22

[IEEE 2011 IEEE 6th International Workshop on Electronic Design, Test and Application (DELTA) - Queenstown, New Zealand (2011.01.17-2011.01.19)] 2011 Sixth IEEE International Symposium on Electronic Design, Test and Application - Automatic Yield Management System for Semiconductor Production Test

Cheng, Huiyuan, Ooi, Melanie Po-Leen, Kuang, Ye Chow, Sim, Eric, Cheah, Bryan, Demidenko, Serge

Year:

2011

Language:

english

File:

PDF, 1.05 MB

english, 2011

23

[IEEE 2011 IEEE 6th International Workshop on Electronic Design, Test and Application (DELTA) - Queenstown, New Zealand (2011.01.17-2011.01.19)] 2011 Sixth IEEE International Symposium on Electronic Design, Test and Application - Data-Driven Condition-Based Maintenance of Test Handlers in Semiconductor Manufacturing

Guan, Timothy, Kuang, Ye Chow, Ooi, Melanie Po-Leen, Cheah, Xiang Gin, Tan, Yeung Shun, Demidenko, Serge

Year:

2011

Language:

english

File:

PDF, 470 KB

english, 2011

24

[IEEE 2010 Fifth IEEE International Symposium on Electronic Design, Test & Applications - Ho Chi Minh City, Vietnam (2010.01.13-2010.01.15)] 2010 Fifth IEEE International Symposium on Electronic Design, Test & Applications - Evaluating the Performance of Different Classification Algorithms for Fabricated Semiconductor Wafers

Cheng, Jian Wei, Ooi, Melanie Po-Leen, Chan, Chris, Kuang, Ye Chow, Demidenko, Serge

Year:

2010

Language:

english

File:

PDF, 318 KB

english, 2010

25

[IEEE 2010 Fifth IEEE International Symposium on Electronic Design, Test & Applications - Ho Chi Minh City, Vietnam (2010.01.13-2010.01.15)] 2010 Fifth IEEE International Symposium on Electronic Design, Test & Applications - Fast and Accurate Automatic Defect CLuster Extraction for Semiconductor Wafers

Ooi, Melanie Po-Leen, Chan, Chris, Tee, Wey Jean, Kuang, Ye Chow, Kleeman, Lindsay, Demidenko, Serge

Year:

2010

Language:

english

File:

PDF, 1.21 MB

english, 2010

26

[IEEE 4th IEEE International Symposium on Electronic Design, Test and Applications (delta 2008) - Hong Kong, China (2008.01.23-2008.01.25)] 4th IEEE International Symposium on Electronic Design, Test and Applications (delta 2008) - Predictive Die-Level Reliability-Yield Modeling for Deep Sub-micron Devices

Ooi, Melanie Po-Leen, Kuang, Ye Chow, Chan, Chris, Demidenko, Serge

Year:

2008

Language:

english

File:

PDF, 442 KB

english, 2008

27

[IEEE 2013 IEEE International Conference on Smart Instrumentation, Measurement and Applications (ICSIMA) - Kuala Lumpur, Malaysia (2013.11.25-2013.11.27)] 2013 IEEE International Conference on Smart Instrumentation, Measurement and Applications (ICSIMA) - Analytic standard uncertainty evaluation of polynomial in normal/uniform random variables

Kuang, Ye Chow, Ooi, Melanie Po-Leen, Rajan, Arvind

Year:

2013

Language:

english

File:

PDF, 149 KB

english, 2013

28

[IEEE 2010 IEEE Instrumentation & Measurement Technology Conference Proceedings - Austin, TX, USA (2010.05.3-2010.05.6)] 2010 IEEE Instrumentation & Measurement Technology Conference Proceedings - Automatic Defect Cluster Extraction for Semiconductor Wafers

Ooi, Melanie Po-Leen, Kwang Joo Sim, Eric, Kuang, Ye Chow, Kleeman, Lindsay, Chan, Chris, Demidenko, Serge

Year:

2010

Language:

english

File:

PDF, 1.64 MB

english, 2010

29

[IEEE 2008 33rd IEEE/CPMT International Electronics Manufacturing Technology Conference (IEMT) - Penang, Malaysia (2008.11.4-2008.11.6)] 2008 33rd IEEE/CPMT International Electronics Manufacturing Technology Conference (IEMT) - Critical assessment of die level predictor models

Ooi, Melanie Po-Leen, Chris Chan,, Su-Lyn Lee,, Wai Loon Chin,, Ling Ying Goh,, Ye Chow Kuang,, Demidenko, Serge

Year:

2008

Language:

english

File:

PDF, 483 KB

english, 2008

30

[IEEE 2011 3rd Asia Symposium on Quality Electronic Design (ASQED 2011) - Kuala Lumpur, Malaysia (2011.07.19-2011.07.20)] 2011 3rd Asia Symposium on Quality Electronic Design (ASQED) - Outlier distribution detection approach to semiconductor wafer fabrication process monitoring

Huiyuan Cheng,, Ooi, Melanie Po-Leen, Ye Chow Kuang,, Demidenko, Serge, Cheah, Bryan

Year:

2011

Language:

english

File:

PDF, 425 KB

english, 2011

31

[IEEE 2009 IEEE Intrumentation and Measurement Technology Conference (I2MTC) - Singapore. Singapore (2009.05.5-2009.05.7)] 2009 IEEE Intrumentation and Measurement Technology Conference - Hardware design of neural network system state observer

Wei Hong Loh,, Kuang, Ye Chow, Ooi, Melanie Po-Leen

Year:

2009

Language:

english

File:

PDF, 665 KB

english, 2009

32

[IEEE 2009 IEEE Intrumentation and Measurement Technology Conference (I2MTC) - Singapore. Singapore (2009.05.5-2009.05.7)] 2009 IEEE Intrumentation and Measurement Technology Conference - Combining ATE and flying probe in-circuit test strategies for load board verification and test

Soh Ying Seah,, Melanie Po-Leen Ooi,, Ye Chow Kuang,, Chee Sun See,, Panchadcharam, Shanti, Demidenko, Serge

Year:

2009

Language:

english

File:

PDF, 662 KB

english, 2009

33

[IEEE 2007 IEEE Instrumentation & Measurement Technology Conference IMTC 2007 - Warsaw, Poland (2007.05.1-2007.05.3)] 2007 IEEE Instrumentation & Measurement Technology Conference IMTC 2007 - A Faster and Cheaper Method of Implementing States Observers using Artificial Neural Networks

Kuang, Ye Chow, Ooi, Melanie Po-Leen

Year:

2007

Language:

english

File:

PDF, 416 KB

english, 2007

34

[IEEE 2012 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) - Graz, Austria (2012.05.13-2012.05.16)] 2012 IEEE International Instrumentation and Measurement Technology Conference Proceedings - Periodic piecewise linear excitation for ADC testing

Ong, Tat Chern, Tee, Min Tong, Kuang, Ye Chow, Ooi, Melanie Po-Leen, Demidenko, Serge

Year:

2012

Language:

english

File:

PDF, 1.45 MB

english, 2012

35

[IEEE 2007 International Conference on Intelligent and Advanced Systems (ICIAS) - Kuala Lumpur (2007.11.25-2007.11.28)] 2007 International Conference on Intelligent and Advanced Systems - An implementation of a radial basis function network states observer

Ye Chow Kuang,, Melanie Po-Leen Ooi,

Year:

2007

Language:

english

File:

PDF, 355 KB

english, 2007

36

Sparse alternating decision tree

Sok, Hong Kuan, Ooi, Melanie Po-Leen, Kuang, Ye Chow

Journal:

Pattern Recognition Letters

Year:

2015

Language:

english

File:

PDF, 853 KB

english, 2015

37

[IEEE 2012 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) - Graz, Austria (2012.05.13-2012.05.16)] 2012 IEEE International Instrumentation and Measurement Technology Conference Proceedings - Low-cost automatic visual inspection system for media in hard disk drive mass production

Chow, Zhi Sheng, Ooi, Melanie Po-Leen, Kuang, Ye Chow, Demidenko, Serge

Year:

2012

Language:

english

File:

PDF, 802 KB

english, 2012

38

Multivariate alternating decision trees

Sok, Hong Kuan, Ooi, Melanie Po-Leen, Kuang, Ye Chow, Demidenko, Serge

Journal:

Pattern Recognition

Year:

2015

Language:

english

File:

PDF, 1.37 MB

english, 2015

39

Analytical Standard Uncertainty Evaluation Using Mellin Transform

Rajan, Arvind, Ooi, Melanie Po-Leen, Ye Chow Kuang,, Demidenko, Serge N.

Journal:

Year:

2015

Language:

english

File:

PDF, 32.64 MB

english, 2015

40

Benchmark Test Distributions for Expanded Uncertainty Evaluation Algorithms

Rajan, Arvind, Kuang, Ye Chow, Ooi, Melanie Po-Leen, Demidenko, Serge N.

Journal:

IEEE Transactions on Instrumentation and Measurement

Year:

2015

Language:

english

File:

PDF, 2.60 MB

english, 2015

41

[IEEE 2005 IEEE Instrumentationand Measurement Technology - Ottawa, ON, Canada (16-19 May 2005)] 2005 IEEE Instrumentationand Measurement Technology Conference Proceedings - Shortening Burn-In Test: Application of Weibull Statistical Analysis & HVST

Melanie Po-Leen Ooi,, Kassim, Z.A., Demidenko, S.

Year:

2005

Language:

english

File:

PDF, 269 KB

english, 2005

42

[IEEE 2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) - Pisa, Italy (2015.5.11-2015.5.14)] 2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings - Digital pathology: Identifying spongiosis in unstained histopathology specimen

Abeysekera, Sanush, Kar, Nicholas, Siew, Wei, Po-Leen Ooi, Melanie, Kuang, Ye Chow, Syed Hassan, Sharifah, Demidenko, Serge

Year:

2015

Language:

english

File:

PDF, 1.42 MB

english, 2015

43

[IEEE 2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) - Pisa, Italy (2015.5.11-2015.5.14)] 2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings - Performance comparison between expanded uncertainty evaluation algorithms

Kuang, Ye Chow, Ooi, Melanie Po-Leen, Rajan, Arvind, Demidenko, Serge

Year:

2015

Language:

english

File:

PDF, 890 KB

english, 2015

44

Complex feature alternating decision tree

Kuang, Ye Chow, Ooi, Melanie Po Leen

Journal:

International Journal of Intelligent Systems Technologies and Applications

Year:

2010

Language:

english

File:

PDF, 1.67 MB

english, 2010

45

Design of embedded differential equation solver

Kuang, Ye Chow, Ooi, Melanie Po Leen, Loh, Wei Hong, Demidenko, Serge

Journal:

International Journal of Intelligent Systems Technologies and Applications

Year:

2009

Language:

english

File:

PDF, 258 KB

english, 2009

46

Outstanding young engineer of the year award 2014 [Society News]

Ooi, Melanie Po-Leen

Journal:

IEEE Instrumentation & Measurement Magazine

Year:

2016

Language:

english

File:

PDF, 242 KB

english, 2016

47

[IEEE 2016 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) - Taipei, Taiwan (2016.5.23-2016.5.26)] 2016 IEEE International Instrumentation and Measurement Technology Conference Proceedings - Automating measurement of renal interstitial fibrosis: Effect of colour spaces on quantification

Tey, Wei Keat, Kuang, Ye Chow, Khoo, Joon Joon, Ooi, Melanie Po-Leen, Demidenko, Serge

Year:

2016

Language:

english

File:

PDF, 5.11 MB

english, 2016

48

[IEEE 2016 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) - Taipei, Taiwan (2016.5.23-2016.5.26)] 2016 IEEE International Instrumentation and Measurement Technology Conference Proceedings - Moment-based measurement uncertainty evaluation for reliability analysis in design optimization

Rajan, Arvind, Kuang, Ye Chow, Ooi, Melanie Po-Leen, Demidenko, Serge N.

Year:

2016

Language:

english

File:

PDF, 956 KB

english, 2016

49

Among the challenges and future trends in I&M [Future Trends in I&M]

Ooi, Melanie Po-Leen

Journal:

IEEE Instrumentation & Measurement Magazine

Year:

2016

Language:

english

File:

PDF, 603 KB

english, 2016

50

Measured Quantity Value Estimator for Multiplicative Nonlinear Measurement Models

Kuang, Ye Chow, Rajan, Arvind, Ooi, Melanie Po-Leen, Demidenko, Serge N.

Journal:

IEEE Transactions on Instrumentation and Measurement

Year:

2017

Language:

english

File:

PDF, 1.08 MB

english, 2017

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